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    GLVLSI
    1998
    IEEE
    106views VLSI» more  GLVLSI 1998»

    Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling

    14 years 3 months ago
    Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling
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    Irith Pomeranz, Sudhakar M. Reddy
    claim paper
    Added 04 Aug 2010
    Updated 04 Aug 2010
    Type Conference
    Year 1998
    Where GLVLSI
    Authors Irith Pomeranz, Sudhakar M. Reddy
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