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ERLANG
2008
ACM
13 years 9 months ago
Early fault detection with model-based testing
Current and future trends for software include increasingly complex requirements on interaction between systems. As a result, the difficulty of system testing increases. Model-bas...
Jonas Boberg
DAC
2008
ACM
14 years 8 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
CODES
2007
IEEE
13 years 11 months ago
A computational reflection mechanism to support platform debugging in SystemC
System-level and Platform-based design, along with Transaction Level modeling (TLM) techniques and languages like SystemC, appeared as a response to the ever increasing complexity...
Bruno Albertini, Sandro Rigo, Guido Araujo, Cristi...
MIDDLEWARE
2009
Springer
14 years 1 months ago
Why Do Upgrades Fail and What Can We Do about It?
Abstract. Enterprise-system upgrades are unreliable and often produce downtime or data-loss. Errors in the upgrade procedure, such as broken dependencies, constitute the leading ca...
Tudor Dumitras, Priya Narasimhan
VTS
2007
IEEE
129views Hardware» more  VTS 2007»
14 years 1 months ago
Supply Voltage Noise Aware ATPG for Transition Delay Faults
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram