Current and future trends for software include increasingly complex requirements on interaction between systems. As a result, the difficulty of system testing increases. Model-bas...
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
System-level and Platform-based design, along with Transaction Level modeling (TLM) techniques and languages like SystemC, appeared as a response to the ever increasing complexity...
Bruno Albertini, Sandro Rigo, Guido Araujo, Cristi...
Abstract. Enterprise-system upgrades are unreliable and often produce downtime or data-loss. Errors in the upgrade procedure, such as broken dependencies, constitute the leading ca...
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...