This paper presents a novel circuit fault detection and isolation technique for quasi delay-insensitive asynchronous circuits. We achieve fault isolation by a combination of physi...
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
Noise affects circuit operation by increasing gate delays and causing latches to capture incorrect values. Noise analysis techniques can detect some of such noise faults, but accu...
Yajun Ran, Alex Kondratyev, Yosinori Watanabe, Mal...
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...