5 search results - page 1 / 1 » A Hybrid Algorithm for Test Point Selection for Scan-Based B... |
DAC
1997
ACM
14 years 21 days ago
1997
ACM
VLSID
2002
IEEE
14 years 9 months ago
2002
IEEE
DFT
2009
IEEE
14 years 3 months ago
2009
IEEE
Recently, a new test point insertion method for pseudo-random built-in self-test (BIST) was proposed in [Yang 09] which tries to use functional flip-flops to drive control test po...
ET
2002
13 years 8 months ago
2002
In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...
ATS
1998
IEEE
14 years 24 days ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...