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» A Linear Metalanguage for Concurrency
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ATS
2000
IEEE
107views Hardware» more  ATS 2000»
13 years 12 months ago
Accumulation-based concurrent fault detection for linear digital state variable systems
An algorithmic fault detection scheme for linear digital state variable systems is proposed. The proposed scheme eliminates the necessity of observing the internal states of the s...
Ismet Bayraktaroglu, Alex Orailoglu
ICCD
2002
IEEE
122views Hardware» more  ICCD 2002»
14 years 12 days ago
Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
Sule Ozev, Alex Orailoglu
ENTCS
2006
141views more  ENTCS 2006»
13 years 7 months ago
A Concurrent Model for Linear Logic
We build a realizability model for linear logic using a name-passing process calculus. The construction is based on testing semantics for processes, drawing ideas from spatial and...
Emmanuel Beffara
ENTCS
2006
146views more  ENTCS 2006»
13 years 7 months ago
Relating State-Based and Process-Based Concurrency through Linear Logic
This paper has the purpose of reviewing some of the established relationships between logic and concurrency, and of exploring new ones. Concurrent and distributed systems are noto...
Iliano Cervesato, Andre Scedrov
ITC
2003
IEEE
162views Hardware» more  ITC 2003»
14 years 22 days ago
Concurrent Error Detection in Linear Analog Circuits Using State Estimation
We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in ge...
Haralampos-G. D. Stratigopoulos, Yiorgos Makris