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ICCAD
2005
IEEE
87views Hardware» more  ICCAD 2005»
16 years 2 months ago
Statistical technology mapping for parametric yield
The increasing variability of process parameters leads to substantial parametric yield losses due to timing and leakage power constraints. Leakage power is especially affected by ...
Ashish Kumar Singh, Murari Mani, Michael Orshansky
DATE
2008
IEEE
74views Hardware» more  DATE 2008»
16 years 15 days ago
A Design-for-Diagnosis Technique for SRAM Write Drivers
∗ Diagnosis is becoming a major concern with the rapid development of semiconductor memories. It provides information about the location of manufacturing defects in the memory, a...
Alexandre Ney, Patrick Girard, Serge Pravossoudovi...
LPNMR
2007
Springer
16 years 5 days ago
GrinGo : A New Grounder for Answer Set Programming
We describe a new grounder system for logic programs under answer set semantics, called GrinGo. Our approach combines and extends techniques from the two primary grounding approach...
Martin Gebser, Torsten Schaub, Sven Thiele
PLDI
2004
ACM
15 years 11 months ago
Cloning-based context-sensitive pointer alias analysis using binary decision diagrams
This paper presents the first scalable context-sensitive, inclusionbased pointer alias analysis for Java programs. Our approach to context sensitivity is to create a clone of a m...
John Whaley, Monica S. Lam
ER
2004
Springer
161views Database» more  ER 2004»
15 years 11 months ago
Towards a Statistically Semantic Web
The envisioned Semantic Web aims to provide richly annotated and explicitly structured Web pages in XML, RDF, or description logics, based upon underlying ontologies and thesauri. ...
Gerhard Weikum, Jens Graupmann, Ralf Schenkel, Mar...