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COMPSAC
2003
IEEE
15 years 11 months ago
An Object-Passing Model for Parallel Programming
This paper introduces an object-passing model for parallel and distributed application development. Object passing provides the object-oriented application developer with powerful...
Jameela Al-Jaroodi, Nader Mohamed
ICPPW
2003
IEEE
15 years 11 months ago
Security Aspects of Wireless Heterogeneous Databases - Protocol, Performance, and Energy Analysis
Users have been demanding information “anytime, anywhere”. The notion of accessing diverse and autonomous information repositories with different APIs is not accepted. This ha...
Harshal Haridas, Ali R. Hurson, Yu Jiao
ISCA
2003
IEEE
114views Hardware» more  ISCA 2003»
15 years 11 months ago
Building Quantum Wires: The Long and the Short of It
As quantum computing moves closer to reality the need for basic architectural studies becomes more pressing. Quantum wires, which transport quantum data, will be a fundamental com...
Mark Oskin, Frederic T. Chong, Isaac L. Chuang, Jo...
ITC
2003
IEEE
106views Hardware» more  ITC 2003»
15 years 11 months ago
Detection of Resistive Shorts in Deep Sub-micron Technologies
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
Bram Kruseman, Stefan van den Oetelaar
DATE
2010
IEEE
161views Hardware» more  DATE 2010»
15 years 11 months ago
BISD: Scan-based Built-In self-diagnosis
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
Melanie Elm, Hans-Joachim Wunderlich