15 search results - page 1 / 3 » A Method to Diagnose Faults in Linear Analog Circuits using ... |
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behavior in a fir...
GLVLSI
2005
IEEE
14 years 1 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
DAC
1998
ACM
13 years 11 months ago
1998
ACM
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...