Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....
In this paper we present external memory algorithms for some string problems. External memory algorithms have been developed in many research areas, as the speed gap between fast ...
Kangho Roh, Maxime Crochemore, Costas S. Iliopoulo...
Abstract. Many applications with large data spaces that cannot run on a typical workstation (due to page faults) call for techniques to expand the effective memory size. One such t...
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
Abstract— Flash memory is widely used in consumer electronics products, such as cell-phones and music players, and is increasingly displacing hard disk drives as the primary stor...
Vidyabhushan Mohan, Sudhanva Gurumurthi, Mircea R....