465 search results - page 10 / 93 » A New Approach for Low Power Scan Testing |
BMCBI
2006
13 years 7 months ago
2006
Background: DNA sequence polymorphisms analysis can provide valuable information on the evolutionary forces shaping nucleotide variation, and provides an insight into the function...
ATS
1996
IEEE
13 years 11 months ago
1996
IEEE
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
TCAD
2011
13 years 2 months ago
2011
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...
DDECS
2007
IEEE
13 years 7 months ago
2007
IEEE
—A Low noise and low power CMOS Image Sensor (CIS) with pixel-level Correlated Double Sampling (CDS) is proposed. As the pixel readout circuit using source follower is major read...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...