465 search results - page 5 / 93 » A New Approach for Low Power Scan Testing |
ISLPED
2005
ACM
14 years 28 days ago
2005
ACM
Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
ISBI
2011
IEEE
12 years 11 months ago
2011
IEEE
Most algorithms used for imaging genetics examine statistical effects of each individual genetic variant, one at a time. We developed a new approach, based on ridge regression, to...
IOLTS
2008
IEEE
14 years 1 months ago
2008
IEEE
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...
ISQED
2010
IEEE
14 years 15 days ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...