465 search results - page 8 / 93 » A New Approach for Low Power Scan Testing |
ICIP
2010
IEEE
13 years 5 months ago
2010
IEEE
This work presents a novel approach in automatic detection of the lung nodules and is compared with respect to parametric nodule models in terms of sensitivity and specificity. A ...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
NIPS
2003
13 years 8 months ago
2003
We have designed and tested a single-chip analog VLSI sensor that detects imminent collisions by measuring radially expansive optic flow. The design of the chip is based on a mode...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
ASPDAC
2009
ACM
14 years 1 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...