945 search results - page 136 / 189 » A New Method for Design of Robust Digital Circuits |
VTS
2007
IEEE
14 years 3 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
CHI
1996
ACM
14 years 1 months ago
1996
ACM
We present a new systematic method of structuring information using mental models. This method can be used both to evaluate the efficiency of an information structure and to build...
MICRO
2007
IEEE
14 years 3 months ago
2007
IEEE
Process variations will greatly impact the stability, leakage power consumption, and performance of future microprocessors. These variations are especially detrimental to 6T SRAM ...
GLVLSI
2002
IEEE
14 years 2 months ago
2002
IEEE
Many computation-intensive or recursive applications commonly found in digital signal processing and image processing applications can be represented by data-flow graphs (DFGs). ...
ASPDAC
2008
ACM
13 years 11 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...