371 search results - page 4 / 75 » A New Method for Interoperability Test Generation |
ICCAD
2000
IEEE
13 years 11 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
TAP
2007
Springer
14 years 1 months ago
2007
Springer
We present a new automatic test generation method for JAVA CARD based on attempts at formal verification of the implementation under test (IUT). Self-contained unit tests in JUnit...
CISS
2011
IEEE
12 years 11 months ago
2011
IEEE
Abstract—Fault detection plays an indispensable role in ensuring the security of smart grid systems. Based on the dynamics of the generators, we show the time evolution of the sm...