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ICCAD
2000
IEEE

A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits

14 years 3 months ago
A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is applied to the response signal of the device under test (DUT). We will show, that in comparison to Fourier transform or no transform at all, particular properties of this transformation are advantageous for mixedsignal test and especially built-in self test. We introduce a new method for test measurement selection based on a non-deterministic parametric fault model for analog circuits. This approach allows for noise and measurement error in testing. We show, how test quality can be optimized in the presented fault model. Our test methodology is demonstrated on an analog CMOS bandpass filter.
Michael Pronath, Volker Gloeckel, Helmut E. Graeb
Added 31 Jul 2010
Updated 31 Jul 2010
Type Conference
Year 2000
Where ICCAD
Authors Michael Pronath, Volker Gloeckel, Helmut E. Graeb
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