371 search results - page 6 / 75 » A New Method for Interoperability Test Generation |
DATE
2002
IEEE
14 years 11 days ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
FOSAD
2005
Springer
14 years 28 days ago
2005
Springer
Smartcards are trusted personal devices designed to store and process confidential data, and to act as secure tokens for providing access to applications and services. Smartcards ...
ICCAD
1998
IEEE
13 years 11 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
MTDT
2003
IEEE
14 years 21 days ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
CADE
2006
Springer
14 years 7 months ago
2006
Springer
In this paper we introduce several new improvements to the bottom-up model generation (BUMG) paradigm. Our techniques are based on non-trivial transformations of first-order probl...