677 search results - page 4 / 136 » A New Start-Up Demonstration Test |
SIGSOFT
2006
ACM
14 years 11 months ago
2006
ACM
We consider the problem if a given program satisfies a specified safety property. Interesting programs have infinite state spaces, with inputs ranging over infinite domains, and f...
DAC
2008
ACM
14 years 12 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
ICCAD
2000
IEEE
14 years 3 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...
NN
2002
Springer
13 years 10 months ago
2002
Springer
In this paper we introduce novel geometric concepts, namely category regions, in the original framework of Fuzzy-ART (FA) and FuzzyARTMAP (FAM). The definitions of these regions a...