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» A Note on Designing Logical Circuits Using SAT
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ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
13 years 11 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
DDECS
2009
IEEE
106views Hardware» more  DDECS 2009»
14 years 2 months ago
Forward and backward guarding in early output logic
—Quasi Delay Insensitive asynchronous logic is a very robust system allowing safe implementations while requiring minimal timing assumptions. Unfortunately the design methodologi...
Charlie Brej, Doug Edwards
ICCAD
1995
IEEE
113views Hardware» more  ICCAD 1995»
13 years 11 months ago
Logic decomposition during technology mapping
—A problem in technology mapping is that the quality of the final implementation depends significantly on the initially provided circuit structure. This problem is critical, es...
Eric Lehman, Yosinori Watanabe, Joel Grodstein, He...
ICCAD
1998
IEEE
112views Hardware» more  ICCAD 1998»
13 years 11 months ago
Using precomputation in architecture and logic resynthesis
Abstract Althoughtremendousadvanceshave been accomplished in logic synthesis in the past two decades, in some cases logic synthesis still cannot attain the improvements possible by...
Soha Hassoun, Carl Ebeling
GLVLSI
2009
IEEE
201views VLSI» more  GLVLSI 2009»
13 years 10 months ago
Glitch-free design for multi-threshold CMOS NCL circuits
In this paper, a novel design is proposed for eliminating glitches and signal bounces during wake-up events that result from incorporating multi-threshold CMOS (MTCMOS) into async...
Ahmad Al Zahrani, Andrew Bailey, Guoyuan Fu, Jia D...