346 search results - page 7 / 70 » A Novel Approach for EMI Design of Power Electronics |
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
VLSI
2005
Springer
14 years 1 months ago
2005
Springer
Leakage power consumption of current CMOS technology is already a great challenge. ITRS projects that leakage power consumption may come to dominate total chip power consumption a...
AHS
2007
IEEE
14 years 2 months ago
2007
IEEE
Biological systems have inherent mechanisms which ensure their adaptation and thus survival — preservation of functionality, despite extreme and varying environments. One such e...
ISQED
2002
IEEE
14 years 25 days ago
2002
IEEE
Critical systems like pace-makers, defibrillators, wearable computers and other electronic gadgets have to be designed not only for reliability but also for ultra-low power consu...
ISLPED
1998
ACM
14 years 4 days ago
1998
ACM
High-level power estimation is essential for designing complex low-power ICs. However, the lack of flexibility, or restriction to synthesizable code of previously presented high-...