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135
Voted
ICCAD
2005
IEEE
16 years 17 days ago
2005
IEEE
Many commercially available embedded processors are capable of extending their base instruction set for a specific domain of applications. While steady progress has been made in t...
115
Voted
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
Negative Bias Temperature Instability (NBTI), a PMOS aging phenomenon causing significant loss on circuit performance and lifetime, has become a critical challenge for temporal re...
141
Voted
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
With the relentless scaling of semiconductor technology, the lifetime reliability of embedded multiprocessor platforms has become one of the major concerns for the industry. If th...
115
Voted
DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
Networks-on-Chip (NoCs) have recently emerged as a scalable alternative to classical bus and point-to-point architectures. To date, performance evaluation of NoC designs is largel...
114
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IPPS
2007
IEEE
15 years 10 months ago
2007
IEEE
Fast hardware turnover in supercomputing centers, stimulated by rapid technological progress, results in high heterogeneity among HPC platforms, and necessitates that applications...