590 search results - page 13 / 118 » A Novel Method to Improve the Test Efficiency of VLSI Tests |
PR
2006
13 years 7 months ago
2006
In many pattern recognition applications, high-dimensional feature vectors impose a high computational cost as well as the risk of "overfitting". Feature Selection addre...
FM
2006
Springer
13 years 11 months ago
2006
Springer
Non-determinism of the thread schedule is a well-known problem in concurrent programming. However, other sources of non-determinism exist which cannot be controlled by an applicati...
SBCCI
2003
ACM
14 years 22 days ago
2003
ACM
As we scale down to deep submicron (DSM) technology, noise is becoming a metric of equal importance as power, speed, and area. Smaller feature sizes, low voltage, and high frequen...
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
－ We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and cr...
ETS
2009
IEEE
13 years 5 months ago
2009
IEEE
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both ...