3 search results - page 1 / 1 » A Parametric Test Method for Analog Components in Integrated... |
ICCAD
2000
IEEE
14 years 10 days ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ROBIO
2006
IEEE
14 years 1 months ago
2006
IEEE
— A fully embedded tactile/force sensor system to be installed on the phalanges of a robot hand is presented in this paper. The sensor consists of a distributed array of analog t...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
Recent work has shown that the use of switched current methods can provide an effective route to implementation of analog IC functionality using a standard digital CMOS process. Fu...