In this paper, a novel low-power design technique is proposed to minimize the standby leakage power in nanoscale CMOS very large scale integration (VLSI) systems by generating the ...
Increasing focus on power dissipation issues in current microprocessors has led to a host of proposals for clock gating and other power-saving techniques. While generally effectiv...
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
Jeremy Lee, Sumit Narayan, Mike Kapralos, Mohammad...
Abstract— A clear deficiency in most of todays Anomaly Intrusion Detection Systems (AIDS) is their inability to distinguish between a new form of legitimate normal behavior and ...