371 search results - page 39 / 75 » A Precedence PEPA Model for Performance and Reliability Anal... |
ICCD
2001
IEEE
14 years 4 months ago
2001
IEEE
Abstract-- Scaling the minimum feature size of VLSI circuits to sub-quarter micron and its clock frequency to 2GHz has caused crosstalk noise to become a serious problem, that degr...
ICASSP
2009
IEEE
14 years 2 months ago
2009
IEEE
This paper develops a Bayesian network (BN) predictor to profile cross-race gene expression data. Cross-race studies face more data variability than single-lab studies. Our desig...
GLVLSI
2007
IEEE
13 years 11 months ago
2007
IEEE
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
In this paper we present a generic interconnect fabric for transaction level modelling tackeling three major aspects. First, a review of the bus and IO structures that we have ana...
IJON
2010
13 years 6 months ago
2010
Originally devoted to specific applications such as biology, medicine and demography, duration models are now widely used in economy, finance or reliability. Recent works in var...