420 search results - page 6 / 84 » A Small Test Generator for Large Designs |
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
DATE
2002
IEEE
14 years 14 days ago
2002
IEEE
This paper develops an improved approach for hierarchical functional test generation for complex chips. In order to deal with the increasing complexity of functional test generati...
CORR
2008
Springer
13 years 7 months ago
2008
Springer
We present a simple and efficient algorithm for randomly generating simple graphs without small cycles. These graphs can be used to design high performance Low-Density Parity-Chec...
CORR
2010
Springer
13 years 7 months ago
2010
Springer
Identification of defective members of large populations has been widely studied in the statistics community under the name of group testing. It involves grouping subsets of items...