420 search results - page 8 / 84 » A Small Test Generator for Large Designs |
VLSID
2005
IEEE
14 years 7 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
KR
2000
Springer
13 years 11 months ago
2000
Springer
Large-scale ontologies are becoming an essential component of many applications including standard search (such as Yahoo and Lycos), ecommerce (such as Amazon and eBay), configura...
ETS
2009
IEEE
13 years 5 months ago
2009
IEEE
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
MTV
2005
IEEE
14 years 1 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
DATE
2010
IEEE
13 years 12 months ago
2010
IEEE
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model chec...