33 search results - page 4 / 7 » A Statistic-Based Approach to Testability Analysis |
DATE
1998
IEEE
13 years 11 months ago
1998
IEEE
Partial Scan techniques have been widely accepted as an effective solution to improve sequential ATPG performance while keeping acceptable area and performance overheads. Several ...
ET
2002
13 years 7 months ago
2002
In this paper we explore two alternative approaches to system diagnosis. The first strategy is based on testability analysis performed by SATAN tool. The second approach performed ...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
CSUR
2000
13 years 7 months ago
2000
: Object-oriented frameworks have extended reusability of software from code modules to architectural and domain information. This paper further extends software reusability from c...
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...