226 search results - page 10 / 46 » A Study on Impact of Leakage Current on Dynamic Power |
ICCD
2007
IEEE
14 years 4 months ago
2007
IEEE
As the VLSI technology marches beyond 65 and 45nm process technologies, variation in gate length has a direct impact on leakage and performance of CMOS transistors. Due to sub-wav...
CASES
2008
ACM
13 years 9 months ago
2008
ACM
This paper proposes a combination of circuit and architectural techniques to maximize leakage power reduction in embedded processor on-chip caches. It targets cache peripheral cir...
ISLPED
2009
ACM
14 years 2 months ago
2009
ACM
The theoretical lower limit of subthreshold swing in MOSFETs (60 mV/decade) significantly restricts low voltage operation since it results in a low ON to OFF current ratio at low ...
ISQED
2010
IEEE
14 years 2 months ago
2010
IEEE
Abstract— As the semiconductor technology continues its marching toward the deep sub-micron domain, the strong relation between leakage current and temperature becomes critical i...
ISLPED
2006
ACM
14 years 1 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...