209 search results - page 34 / 42 » A Systematic Approach for Designing Testable VLSI Circuits |
VLSID
2006
IEEE
14 years 8 months ago
2006
IEEE
Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
VLSID
1999
IEEE
13 years 12 months ago
1999
IEEE
Recently Lillis, et al. presented an elegant dynamic programming approach to RC interconnect delay optimization through driver sizing, repeater insertion, and, wire sizing which e...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
ISPD
2005
ACM
14 years 1 months ago
2005
ACM
The sustained progress of VLSI technology has altered the landscape of routing which is a major physical design stage. For timing driven routings, traditional approaches which con...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
We present the first efficient approach to global routing that takes spacing-dependent costs into account and provably finds a near-optimum solution including these costs. We sh...