158 search results - page 18 / 32 » A Test Pattern Generation Algorithm Exploiting Behavioral In... |
DATE
2010
IEEE
14 years 23 days ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
ICCAD
1999
IEEE
13 years 12 months ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
NSPW
2004
ACM
14 years 1 months ago
2004
ACM
(by Victor Raskin) This panel will address users’ perceptions and misperceptions of the risk/benefit and benefit/nuisance ratios associated with information security products, an...
ET
2010
13 years 6 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
EMS
2009
IEEE
14 years 2 months ago
2009
IEEE
—In the future smart city, new information and communication technologies will enable a better management of the available resources. The future smart grid infrastructure is emer...