Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
Cost effective SOC test strongly hinges on parallel, independent test of SOC cores, which can only be ensured through proper core isolation techniques. While a core isolation mech...
We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...