2576 search results - page 12 / 516 » A case study in test management |
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
In this paper we describe how we applied a BIST-based approach to the test of a logic core to be included in System-on-achip (SoC) environments. The approach advantages are the ab...
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ICSE
2012
IEEE-ACM
11 years 9 months ago
2012
IEEE-ACM
—As smartphones become popular, manufacturers such as Samsung Electronics are developing smartphones with rich functionality such as a camera and photo editing quickly, which acc...
ITC
2003
IEEE
14 years 19 days ago
2003
IEEE
At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
ICTAC
2010
Springer
13 years 5 months ago
2010
Springer
Flash memory has become a virtually indispensable component for mobile devices in today’s information society. However, conventional testing methods often fail to detect hidden b...
COMPSAC
2005
IEEE
14 years 1 months ago
2005
IEEE
Two main issues need to be covered when dealing with the dependability of component-based systems: quality assurance of reusable software components and quality assurance of the a...