121 search results - page 21 / 25 » A cell-based power estimation in CMOS combinational circuits |
ISLPED
2006
ACM
14 years 1 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
ASPDAC
2010
ACM
13 years 5 months ago
2010
ACM
In this paper, we present a new voltage IR drop analysis approach for large on-chip power delivery networks. The new approach is based on recently proposed sampling based reductio...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on ...
MICRO
2010
IEEE
13 years 5 months ago
2010
IEEE
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
Achieving design closure is one of the biggest headaches for modern VLSI designers. This problem is exacerbated by high-level design automation tools that ignore increasingly impo...