29 search results - page 4 / 6 » A decoupling method for analysis of coupled RLC interconnect... |
ASPDAC
2004
ACM
14 years 25 days ago
2004
ACM
As the process technology advances into the deep submicron era, interconnect plays a dominant role in determining circuit performance and signal integrity. Buffer insertion is one...
GLVLSI
2010
IEEE
13 years 11 months ago
2010
IEEE
The electromagnetic interaction of on-chip antennas and metal interconnects modeled in a 250 nm complementary metal-oxide semiconductor (CMOS) technology is investigated. A finite...
VLSID
2000
IEEE
13 years 11 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
ISCAS
2003
IEEE
14 years 20 days ago
2003
IEEE
High frequency digital LSIs usually consist of many subcircuits coupled with multi-conductor interconnects embedded in the substrate. They sometimes cause serious problems of the ...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Capturing RLCK circuit responses accurately with existing model order reduction (MOR) techniques is very expensive. Direct metrics for fast analysis of RC circuits exist but there...