The inductance effects become significant for sub-100nm process designs due to increasing interconnect lengths, lower interconnect resistance values and fast signal transition tim...
Santosh Shah, Arani Sinha, Li Song, Narain D. Aror...
As very large scale integration (VLSI) circuit speed rapidly increases, the inductive effects of interconnect lines strongly impact the signal integrity of a circuit. Since these i...
Yungseon Eo, Seongkyun Shin, William R. Eisenstadt...
Analytical compact form models for the signal transient and crosstalk noise of two-coupled RLC lines are developed. Capacitive and inductive coupling effects are investigated and ...
Taehoon Kim, Dongchul Kim, Jung-A Lee, Yungseon Eo
This paper introduces an efficient and accurate interconnect simulation technique. A new formulation for typical VLSI interconnect structures is proposed which, in addition to pr...
In this paper we describe several novel sparsification techniques used in a Fast Stochastic Integral Equation Solver to compute the mean value and the variance of capacitance of ...