65 search results - page 11 / 13 » A low dynamic power and low leakage power 90-nm CMOS square-... |
HPCA
2011
IEEE
12 years 11 months ago
2011
IEEE
Extreme technology integration in the sub-micron regime comes with a rapid rise in heat dissipation and power density for modern processors. Dynamic voltage scaling is a widely us...
MICRO
2002
IEEE
13 years 7 months ago
2002
IEEE
On-chip caches represent a sizeable fraction of the total power consumption of microprocessors. Although large caches can significantly improve performance, they have the potentia...
IOLTS
2005
IEEE
14 years 1 months ago
2005
IEEE
With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
As a result of aggressive technology scaling, gate leakage (gate oxide direct tunneling) has become a major component of total power dissipation. Use of dielectrics of higher perm...
JCP
2008
13 years 7 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...