179 search results - page 10 / 36 » A new test pattern generation method for delay fault testing |
ICCAD
1997
IEEE
14 years 28 days ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
VTS
1997
IEEE
14 years 27 days ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
ICCD
2004
IEEE
14 years 5 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
IOLTS
2005
IEEE
14 years 2 months ago
2005
IEEE
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
ISESE
2002
IEEE
14 years 1 months ago
2002
IEEE
Recent software systems contain a lot of functions to provide various services. According to this tendency, software testing becomes more difficult than before and cost of testing...