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» A scalable method for the generation of small test sets
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IJCAI
2007
13 years 9 months ago
Learning to Identify Unexpected Instances in the Test Set
Traditional classification involves building a classifier using labeled training examples from a set of predefined classes and then applying the classifier to classify test instan...
Xiaoli Li, Bing Liu, See-Kiong Ng
TCAD
2008
119views more  TCAD 2008»
13 years 7 months ago
Bridging Fault Test Method With Adaptive Power Management Awareness
Abstract--A key design constraint of circuits used in handheld devices is the power consumption, mainly due to battery life limitations. Adaptive power management (APM) techniques ...
S. Saqib Khursheed, Urban Ingelsson, Paul M. Rosin...
DATE
2002
IEEE
98views Hardware» more  DATE 2002»
14 years 22 days ago
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael ...
ECAI
2010
Springer
13 years 8 months ago
On Testing Answer-Set Programs
Answer-set programming (ASP) is a well-acknowledged paradigm for declarative problem solving, yet comparably little effort has been spent on the investigation of methods to support...
Tomi Janhunen, Ilkka Niemelä, Johannes Oetsch...
ICCD
2006
IEEE
131views Hardware» more  ICCD 2006»
14 years 4 months ago
Power-Constrained SOC Test Schedules through Utilization of Functional Buses
— In this paper, we are proposing a core-based test methodology that utilizes the functional bus for test stimuli and response transportation. An efficient algorithm for the gen...
Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orail...