— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...