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ASPDAC
2005
ACM
142views Hardware» more  ASPDAC 2005»
13 years 9 months ago
Bridging fault testability of BDD circuits
Abstract— In this paper we study the testability of circuits derived from Binary Decision Diagrams (BDDs) under the bridging fault model. It is shown that testability can be form...
Junhao Shi, Görschwin Fey, Rolf Drechsler
DATE
2004
IEEE
143views Hardware» more  DATE 2004»
13 years 11 months ago
Fault-Tolerant Deployment of Embedded Software for Cost-Sensitive Real-Time Feedback-Control Applications
Designing cost-sensitive real-time control systems for safetycritical applications requires a careful analysis of the cost/coverage trade-offs of fault-tolerant solutions. This fu...
Claudio Pinello, Luca P. Carloni, Alberto L. Sangi...
ICES
2003
Springer
93views Hardware» more  ICES 2003»
14 years 15 days ago
A Genetic Representation for Evolutionary Fault Recovery in Virtex FPGAs
Most evolutionary approaches to fault recovery in FPGAs focus on evolving alternative logic configurations as opposed to evolving the intra-cell routing. Since the majority of tra...
Jason D. Lohn, Gregory V. Larchev, Ronald F. DeMar...
ICCAD
2004
IEEE
141views Hardware» more  ICCAD 2004»
14 years 4 months ago
The effects of energy management on reliability in real-time embedded systems
Abstract—The slack time in real-time systems can be used by recovery schemes to increase system reliability as well as by frequency and voltage scaling techniques to save energy....
Dakai Zhu, Rami G. Melhem, Daniel Mossé
DAC
2009
ACM
14 years 8 months ago
Fault models for embedded-DRAM macros
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
Ching-Yu Chin, Hao-Yu Yang, Mango Chia-Tso Chao, R...