193 search results - page 29 / 39 » Accurate power estimation for large sequential circuits |
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
BMCBI
2006
13 years 8 months ago
2006
Background: The estimation of the difference between two evolutionary distances within a triplet of homologs is a common operation that is used for example to determine which of t...
TCAD
2008
13 years 7 months ago
2008
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...
ISPD
2009
ACM
14 years 2 months ago
2009
ACM
The multiple-supply voltage (MSV) design style has been extensively applied to mitigate dynamic-power consumption. The MSV design paradigm, however, brings many crucial challenges...
ISCAS
2006
IEEE
14 years 2 months ago
2006
IEEE
—This paper introduces a technique to measure and adjust the relative phase of on-chip high speed digital signals using a random sampling technique of inferential statistics. The...