Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...
This paper presents a swarm intelligence based approach to optimally partition combinational CMOS circuits for pseudoexhaustive testing. The partitioning algorithm ensures reducti...
Ganesh K. Venayagamoorthy, Scott C. Smith, Gaurav ...
Multi-FPGA systems (MFSs) are used as custom computing machines, logic emulators and rapid prototyping vehicles. A key aspect of these systems is their programmable routing archit...