7 search results - page 1 / 2 » Adapting an SoC to ATE Concurrent Test Capabilities |
ITC
2002
IEEE
14 years 12 days ago
2002
IEEE
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
- The intrinsic capability brought by each new technology node opens the way to a broad range of system integration options and continuously enables new applications to be integrat...
TVLSI
2008
13 years 7 months ago
2008
Lifetime concerns for complex systems-on-a-chip (SoC) designs due to decreasing levels in reliability motivate the development of solutions to ensure reliable operation. A precurso...
ASAP
2004
IEEE
13 years 11 months ago
2004
IEEE
We explain how modern programmable logic devices have capabilities that are well suited for them to assume a central role in the implementation of networked systems, now and in th...