Economic testing of small devices like LCD drivers is a real challenge. In this paper we describe an approach where a production tester is extended by a memory test engine (MTE). ...
Oliver Spang, Hans Martin von Staudt, Michael G. W...
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
The purpose of this paper is to develop a exible design for test methodology for testing a core-based system on chip SOC. The novel feature of the approach is the use an embedde...
Christos A. Papachristou, F. Martin, Mehrdad Noura...
Despite substantial research on methods and tools for testing reusable modules, little help is available for the tester in the eld. Commercial tools for system testing are widely ...
Daniel Hoffman, Jayakrishnan Nair, Paul A. Stroope...