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DATE
2007
IEEE
68views Hardware» more  DATE 2007»
15 years 10 months ago
A sophisticated memory test engine for LCD display drivers
Economic testing of small devices like LCD drivers is a real challenge. In this paper we describe an approach where a production tester is extended by a memory test engine (MTE). ...
Oliver Spang, Hans Martin von Staudt, Michael G. W...
DATE
2006
IEEE
108views Hardware» more  DATE 2006»
15 years 10 months ago
Test compaction for transition faults under transparent-scan
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...
Irith Pomeranz, Sudhakar M. Reddy
111
Voted
ITC
2000
IEEE
93views Hardware» more  ITC 2000»
15 years 8 months ago
Stuck-fault tests vs. actual defects
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
Edward J. McCluskey, Chao-Wen Tseng
125
Voted
DAC
1999
ACM
15 years 8 months ago
Microprocessor Based Testing for Core-Based System on Chip
The purpose of this paper is to develop a exible design for test methodology for testing a core-based system on chip SOC. The novel feature of the approach is the use an embedde...
Christos A. Papachristou, F. Martin, Mehrdad Noura...
122
Voted
SIGADA
1998
Springer
15 years 8 months ago
Testing Generic Ada Packages with APE
Despite substantial research on methods and tools for testing reusable modules, little help is available for the tester in the eld. Commercial tools for system testing are widely ...
Daniel Hoffman, Jayakrishnan Nair, Paul A. Stroope...