21183 search results - page 45 / 4237 » Adaptive Testing by Test |
112
Voted
VLSID
2002
IEEE
16 years 4 months ago
2002
IEEE
This paper considers reducing the cost of test application by permuting test vectors to improve their defect coverage. Algorithms for test reordering are developed with the goal o...
119
Voted
GI
2007
Springer
15 years 10 months ago
2007
Springer
: In addition to the growing complexity of software systems, test effort takes increasing amounts of time and correspondingly more money. Testing costs may be reduced without compr...
128
Voted
VLSID
2002
IEEE
16 years 4 months ago
2002
IEEE
External pins for test are precious hardware resources because this number is strongly restricted. Cores are tested via test access mechanisms (TAMs) such as a test bus architectu...
125
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DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
125
click to vote
SNPD
2004
15 years 5 months ago
2004
The problem of testing programs without test oracles is well known. A commonly used approach is to use special values in testing but this is often insufficient to ensure program c...