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132
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VLSID
2005
IEEE
16 years 4 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
A two-wire test strategy with simultaneous bidirectional data flow and an independent clock line enables very high site count low-cost wafer probing.
SIGSOFT
2007
ACM
16 years 4 months ago
2007
ACM
130
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QSIC
2006
IEEE
15 years 10 months ago
2006
IEEE
This paper describes a prototype tool, called SimC, which automatically generates test data for unit testing of C programs. The tool symbolically simulates the execution of the gi...