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127
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DDECS
2007
IEEE
15 years 10 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
152
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GLVLSI
2005
IEEE
15 years 9 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
112
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
—The admission control problem is concerned with determining whether a new task may be accepted by a system consisting of a set of running tasks, such that the already admitted a...
151
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ET
2010
15 years 1 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
113
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ICALT
2008
IEEE
15 years 10 months ago
2008
IEEE
The goal of this work is the design and construction of adaptive tutorials based on the application of algorithms for the automatic resolution of problems which can be used to aut...