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DAC
2008
ACM
14 years 9 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
DAC
2006
ACM
14 years 9 months ago
Stochastic variational analysis of large power grids considering intra-die correlations
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
Praveen Ghanta, Sarma B. K. Vrudhula, Sarvesh Bhar...
ICML
2000
IEEE
14 years 9 months ago
Rates of Convergence for Variable Resolution Schemes in Optimal Control
This paper presents a general method to derive tight rates of convergence for numerical approximations in optimal control when we consider variable resolution grids. We study the ...
Andrew W. Moore, Rémi Munos
SIGSOFT
2007
ACM
14 years 9 months ago
Programming asynchronous layers with CLARITY
Asynchronous systems components are hard to write, hard to reason about, and (not coincidentally) hard to mechanically verify. In order to achieve high performance, asynchronous c...
Prakash Chandrasekaran, Christopher L. Conway, Jos...
SIGSOFT
2007
ACM
14 years 9 months ago
Measuring empirical computational complexity
The standard language for describing the asymptotic behavior of algorithms is theoretical computational complexity. We propose a method for describing the asymptotic behavior of p...
Simon Goldsmith, Alex Aiken, Daniel Shawcross Wilk...