The fields of machine learning and mathematical programming are increasingly intertwined. Optimization problems lie at the heart of most machine learning approaches. The Special T...
In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...
The use of Support Vector Machines (SVMs) to represent the performance space of analog circuits is explored. In abstract terms, an analog circuit maps a set of input design parame...
Fernando De Bernardinis, Michael I. Jordan, Albert...
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
— One of the main tasks software testing involves is the generation of the test inputs to be used during the test. Due to its expensive cost, the automation of this task has beco...