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JMLR
2006
108views more  JMLR 2006»
13 years 8 months ago
The Interplay of Optimization and Machine Learning Research
The fields of machine learning and mathematical programming are increasingly intertwined. Optimization problems lie at the heart of most machine learning approaches. The Special T...
Kristin P. Bennett, Emilio Parrado-Hernánde...
DAC
2007
ACM
14 years 9 months ago
Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage
In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...
Tao Li, Zhiping Yu
DAC
2003
ACM
14 years 9 months ago
Support vector machines for analog circuit performance representation
The use of Support Vector Machines (SVMs) to represent the performance space of analog circuits is explored. In abstract terms, an analog circuit maps a set of input design parame...
Fernando De Bernardinis, Michael I. Jordan, Albert...
ICCAD
2006
IEEE
107views Hardware» more  ICCAD 2006»
14 years 5 months ago
Current path analysis for electrostatic discharge protection
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
Hung-Yi Liu, Chung-Wei Lin, Szu-Jui Chou, Wei-Ting...
CEC
2009
IEEE
14 years 2 months ago
An evaluation of Differential Evolution in software test data generation
— One of the main tasks software testing involves is the generation of the test inputs to be used during the test. Due to its expensive cost, the automation of this task has beco...
Ricardo Landa Becerra, Ramón Sagarna, Xin Y...