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» Alternative Test Methods Using IEEE 1149.4
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ICCAD
2000
IEEE
171views Hardware» more  ICCAD 2000»
14 years 1 days ago
A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
Michael Pronath, Volker Gloeckel, Helmut E. Graeb
DATE
2007
IEEE
138views Hardware» more  DATE 2007»
14 years 2 months ago
An ADC-BiST scheme using sequential code analysis
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
Erdem Serkan Erdogan, Sule Ozev
AINA
2008
IEEE
13 years 9 months ago
3MOKAN: A Novel Mobility Management Mechanism Based on Keeping Alternative Nodes
A mobile ad hoc network (MANET) is a network without any predefined infrastructure in which every node not only enjoys the services from the network, but serves the network as a r...
Mahmood Hasanlou, Ebrahim Fazli, Ali Movaghar, Hos...
ITCC
2005
IEEE
14 years 1 months ago
Disciplined Methods of Software Specification: A Case Study
We describe our experience applying tabular mathematical approaches to software specifications. Our purpose is to show alternative approaches to writing tabular specifications and...
Robert L. Baber, David Lorge Parnas, Sergiy A. Vil...
ETS
2010
IEEE
150views Hardware» more  ETS 2010»
13 years 6 months ago
Predicting dynamic specifications of ADCs with a low-quality digital input signal
— A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A noisy and nonlinear pulse is applied as the test stimulus, which is suitable for...
Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff